WebIn this work, a sulfidization mechanism of malachite was confirmed based on the depth profile product, principal component, and depth profile curve analyses of time-of-flight secondary ion mass spectrometry (TOF-SIMS). The results showed that Cu/S species, including fragment ion peaks of Cu2S+, Cu3S+, S−, HS−, S2−, CuS2−, and … WebCustom TOF. platform will accelerate your project. Partner with us to design and manufacture a mass spectrometer that meets your unique requirements. Atmospheric Pressure Interface for sources such as ESI, DART, or APCI. Mid- Pressure Interface for sources such as GD or CI. Low Pressure Interface for sources such as EI or PI.
USA, Inc. - Microscopy Society of America
WebIONTOF GmbH will be exhibiting at ECASIA 2024 in Limerick.Our colleagues Sven Kayser and Thomas Grehl will attend the meeting and present on latest developments in TOF-SIMS and LEIS instrumentation and application. > Tuesday, May 31, 2024, Session 5A, 2:00 PM - 4:00 PM Orbitrap™ MS/MS and TOF MS/MS: A comparison of two new approaches for … WebInnovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight … small lasko heaters
IONTOF - TOF-SIMS (time of flight secondary ion mass …
Web14 apr. 2024 · Since Ar-gas cluster ion beams (Ar-GCIBs) have been introduced into time-of-flight secondary ion mass spectrometry (ToF-SIMS), there have been various attempts to analyze organic materials and biomolecules that require low-damage analysis and high sensitivity, because Ar-GCIBs allow soft ionization of large molecules such as peptides … Web4 jul. 2024 · Tof USA Inc. follows Tof Group Industry values based on more than 70 years of knowledge about manufacturing and a very strong passion for beverage business … Webof a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. ... The capabilities of time-of-flight secondary ion mass … small laser printers for home use